Atomic Force Microscopy

Belgium: VITO - Atomic Force Microscopy

Category:
C. Particle Characterisation in and ex-situ

Institute: VITO

Location: Boeretang 200, 2400 Mol, Belgium

Contact Details of Technology Expert:

Rosita Persoons
Phone: +32 (0)14 335730
Fax: +32 (0)14 321186

See short technology description here.

All Equipment: Belgium: VITO

Ireland: TCD - Atomic Force Microscopy

Category:
C. Particle Characterisation in and ex-situ and/or X

Institute: CRANN, Trinity College Dublin

Location: CRANN, Trinity College Dublin, Dublin 2, Ireland

Contact Details of Technology Expert:

Dr Jing Jing Wang
Phone: 0035318964633

See short technology description here.

All Equipment: Ireland: TCD

Netherlands: WU - Atomic Force Microscopy

Category:
C. Particle Characterisation in and ex-situ and/or

Institute: Wageningen University, Laboratory of Organic Chemistry

Location: Building 316, Wageningen University, Dreijenplein 8, 6703 HB Wageningen, The Netherlands

Contact Details of Technology Expert:

Dr. ing. Marcel Giesbers
Phone: +31 317 482185
Fax: +31 317 484914

See short technology description here.

All Equipment: Netherlands: WU

Spain: ICN - Atomic Force Microscopy

Category:
C. Particle Characterisation in and ex-situ and/or

Institute: Institut Català de Nanotecnologia (ICN)

Location: Campus UAB

Contact Details of Technology Expert:

Jordi Piella
Phone: +34-93 737 46 24

See short technology description here.

All Equipment: Spain: ICN

Sweden: UU - Atomic Force Microscopy

Category:
C. Particle Characterisation in and ex-situ

Institute: Uppsala University (UU)

Location: Ångström Laboratory, Lägerhyddsv. 1, Uppsala, Sweden

Contact Details of Technology Expert:

Fredric Ericson
Phone: +46 (0)18 471 3090
Fax: +46 (0)18 471 3380

See short technology description here.

All Equipment: Sweden: UU


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