Focused Ion Beam (FIB)

Germany: KIT - Focused Ion Beam (FIB)

Category:
C. Particle Characterisation in- and ex-situ

Institute: KIT

Location: Laboratory for Electron Microscopy (LEM),
Karlsruhe Institute of Technology (KIT), Campus South, Building 30.22, Engesserstr. 7, D-76131 Karlsruhe, Germany

Contact Details of Technology Expert:

Prof. Dr. Dagmar Gerthsen
Phone: +49 721 608-43200
Fax: +49 721 608-43207

See short technology description here.

All Equipment: Germany: KIT

Ireland: TCD - Focused Ion Beam (FIB)

Category:
B. Particle Labelling and/or
C. Particle Characterisation in and ex-situ

Institute: CRANN, Trinity College Dublin

Location: CRANN Advanced Microscopy Laboratory,
Unit 27-29, Trinity Enterprise Centre, Grand Canal Quay,
Dublin 2, Ireland

Contact Details of Technology Expert:

Dr. Colm Faulkner
Phone: +353-1-896 4170
Fax: +353-1-896 3037

See short technology description here.

All Equipment: Ireland: TCD


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