Focused Ion Beam (FIB)
Germany: KIT - Focused Ion Beam (FIB)
Category:
C. Particle Characterisation in- and ex-situ
Institute: KIT
Location: Laboratory for Electron Microscopy (LEM),
Karlsruhe Institute of Technology (KIT), Campus South, Building 30.22, Engesserstr. 7, D-76131 Karlsruhe, Germany
Contact Details of Technology Expert:
Prof. Dr. Dagmar Gerthsen
Phone: +49 721 608-43200
Fax: +49 721 608-43207
See short technology description here.
C. Particle Characterisation in- and ex-situ
Institute: KIT
Location: Laboratory for Electron Microscopy (LEM),
Karlsruhe Institute of Technology (KIT), Campus South, Building 30.22, Engesserstr. 7, D-76131 Karlsruhe, Germany
Contact Details of Technology Expert:
Prof. Dr. Dagmar Gerthsen
Phone: +49 721 608-43200
Fax: +49 721 608-43207
See short technology description here.
All Equipment: Germany: KIT
Ireland: TCD - Focused Ion Beam (FIB)
Category:
B. Particle Labelling and/or
C. Particle Characterisation in and ex-situ
Institute: CRANN, Trinity College Dublin
Location: CRANN Advanced Microscopy Laboratory,
Unit 27-29, Trinity Enterprise Centre, Grand Canal Quay,
Dublin 2, Ireland
Contact Details of Technology Expert:
Dr. Colm Faulkner
Phone: +353-1-896 4170
Fax: +353-1-896 3037
See short technology description here.
B. Particle Labelling and/or
C. Particle Characterisation in and ex-situ
Institute: CRANN, Trinity College Dublin
Location: CRANN Advanced Microscopy Laboratory,
Unit 27-29, Trinity Enterprise Centre, Grand Canal Quay,
Dublin 2, Ireland
Contact Details of Technology Expert:
Dr. Colm Faulkner
Phone: +353-1-896 4170
Fax: +353-1-896 3037
See short technology description here.
All Equipment: Ireland: TCD