Focused Ion Beam (FIB)
Germany: KIT - Focused Ion Beam (FIB)
Category:
C. Particle Characterisation in- and ex-situ
Institute: KIT
Location: Laboratory for Electron Microscopy (LEM),
Karlsruhe Institute of Technology (KIT), Campus South, Building 30.22, Engesserstr. 7, D-76131 Karlsruhe, Germany
Contact Details of Technology Expert:
Prof. Dr. Dagmar Gerthsen
Phone: +49 721 608-43200
Fax: +49 721 608-43207
See short technology description here.
C. Particle Characterisation in- and ex-situ
Institute: KIT
Location: Laboratory for Electron Microscopy (LEM),
Karlsruhe Institute of Technology (KIT), Campus South, Building 30.22, Engesserstr. 7, D-76131 Karlsruhe, Germany
Contact Details of Technology Expert:
Prof. Dr. Dagmar Gerthsen
Phone: +49 721 608-43200
Fax: +49 721 608-43207
See short technology description here.
All Equipment: Germany: KIT
Ireland: TCD - Focused Ion Beam (FIB)
Category:
B. Particle Labelling and/or
C. Particle Characterisation in and ex-situ
Institute: CRANN, Trinity College Dublin
Location: CRANN Advanced Microscopy Laboratory,
Unit 27-29, Trinity Enterprise Centre, Grand Canal Quay,
Dublin 2, Ireland
Contact Details of Technology Expert:
Dr. Colm Faulkner
Phone: +353-1-896 4170
Fax: +353-1-896 3037
See short technology description here.
B. Particle Labelling and/or
C. Particle Characterisation in and ex-situ
Institute: CRANN, Trinity College Dublin
Location: CRANN Advanced Microscopy Laboratory,
Unit 27-29, Trinity Enterprise Centre, Grand Canal Quay,
Dublin 2, Ireland
Contact Details of Technology Expert:
Dr. Colm Faulkner
Phone: +353-1-896 4170
Fax: +353-1-896 3037
See short technology description here.
All Equipment: Ireland: TCD
Jun 11, 2015
|
Posted by: admin
|
Other
QualityNano is pleased to annouce that the 2015 Edition of the EU Nanosafety Cluster compendium is now available to download from the NSC website, and contains updates from 28 FP7 projects (including updates from several projects that ended some time ago) as well as the first entries from Horizon2020 nanosafety focussed projects.
Mar 23, 2014
|
Posted by: admin
|
Other
